Critical errors? ATA Error Count

A

Al Bogner

I have a brand new Samsung SP1614N and noticed that the ATA Errors
increase from hour to hour.

ATA Error Count: 12800 (device log contains only the most recent
five errors)

I think this is no good sign too?
195 Hardware_ECC_Recovered 0x000a 100 100 000 Old_age
Always - 192199876

Self-Test show no errors. So is there a problem with the interface?

For more details see below.

Al


smartctl -a /dev/hda
smartctl version 5.30 Copyright (C) 2002-4 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG SP1614N
Firmware Version: TM100-24
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0
Local Time is: Sun Jun 13 13:09:24 2004 CEST

==> WARNING: May need -F samsung or -F samsung2 enabled; see manual
for details.


SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x80) Offline data collection
activity was
never started.
Auto Offline Data
Collection: Enabled.
Self-test execution status: ( 0) The previous self-test
routine completed
without error or no
self-test has ever
been run.
Total time to complete Offline
data collection: (5760) seconds.
Offline data collection
capabilities: (0x1b) SMART execute Offline
immediate.
Auto Offline data collection
on/off support.
Suspend Offline collection
upon new
command.
Offline surface scan
supported.
Self-test supported.
No Conveyance Self-test
supported.
No Selective Self-test
supported.
SMART capabilities: (0x0003) Saves SMART data before
entering
power-saving mode.
Supports SMART auto save
timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging
support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 96) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE
UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 051 Pre-fail
Always - 3
3 Spin_Up_Time 0x0007 065 065 000 Pre-fail
Always - 6016
4 Start_Stop_Count 0x0032 100 100 000 Old_age
Always - 37
5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail
Always - 0
7 Seek_Error_Rate 0x000b 253 253 051 Pre-fail
Always - 0
8 Seek_Time_Performance 0x0024 253 253 000 Old_age
Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age
Always - 7958
10 Spin_Retry_Count 0x0013 253 253 049 Pre-fail
Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age
Always - 24
194 Temperature_Celsius 0x0022 130 088 000 Old_age
Always - 36
195 Hardware_ECC_Recovered 0x000a 100 100 000 Old_age
Always - 192199876
196 Reallocated_Event_Count 0x0012 253 253 000 Old_age
Always - 0
197 Current_Pending_Sector 0x0033 253 253 010 Pre-fail
Always - 0
198 Offline_Uncorrectable 0x0031 253 253 010 Pre-fail
Offline - 0
199 UDMA_CRC_Error_Count 0x000b 100 100 051 Pre-fail
Always - 0
200 Multi_Zone_Error_Rate 0x000b 100 100 051 Pre-fail
Always - 0
201 Soft_Read_Error_Rate 0x000b 100 100 051 Pre-fail
Always - 0

SMART Error Log Version: 1
ATA Error Count: 12800 (device log contains only the most recent
five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Timestamp = decimal seconds since the previous disk power-on.
Note: timestamp "wraps" after 2^32 msec = 49.710 days.

Error 12800 occurred at disk power-on lifetime: 55 hours
When the command that caused the error occurred, the device was
active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 8f ba 1d e0 Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Timestamp Command/Feature_Name
-- -- -- -- -- -- -- -- --------- --------------------
ef 85 00 8f ba 1d e0 00 110.000 SET FEATURES [Disable APM]
b0 d5 01 01 4f c2 e0 00 85.500 SMART READ LOG
b0 d5 01 06 4f c2 e0 00 85.500 SMART READ LOG
b0 d0 01 00 4f c2 e0 00 85.438 SMART READ DATA
b0 da 00 00 4f c2 00 00 85.000 SMART RETURN STATUS

Error 12799 occurred at disk power-on lifetime: 55 hours
When the command that caused the error occurred, the device was
active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 8f ba 1d e0 Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Timestamp Command/Feature_Name
-- -- -- -- -- -- -- -- --------- --------------------
ef 85 00 8f ba 1d e0 00 115.125 SET FEATURES [Disable APM]
b0 d5 01 01 4f c2 e0 00 90.563 SMART READ LOG
b0 d5 01 06 4f c2 e0 00 90.500 SMART READ LOG
b0 d0 01 00 4f c2 e0 00 90.438 SMART READ DATA
b0 da 00 00 4f c2 00 00 90.063 SMART RETURN STATUS

Error 12798 occurred at disk power-on lifetime: 55 hours
When the command that caused the error occurred, the device was
active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 af d0 84 e0 Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Timestamp Command/Feature_Name
-- -- -- -- -- -- -- -- --------- --------------------
ef 85 00 af d0 84 e0 00 7894.875 SET FEATURES [Disable APM]
b0 d5 01 01 4f c2 e0 00 7869.500 SMART READ LOG
b0 d5 01 06 4f c2 e0 00 7869.500 SMART READ LOG
b0 d0 01 00 4f c2 e0 00 7869.438 SMART READ DATA
b0 da 00 00 4f c2 00 00 7869.000 SMART RETURN STATUS

Error 12797 occurred at disk power-on lifetime: 53 hours
When the command that caused the error occurred, the device was
active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 8f ba 1d e0 Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Timestamp Command/Feature_Name
-- -- -- -- -- -- -- -- --------- --------------------
ef 85 00 8f ba 1d e0 00 113.875 SET FEATURES [Disable APM]
b0 d5 01 01 4f c2 e0 00 108.750 SMART READ LOG
b0 d5 01 06 4f c2 e0 00 108.688 SMART READ LOG
b0 d0 01 00 4f c2 e0 00 108.500 SMART READ DATA
b0 da 00 00 4f c2 00 00 107.938 SMART RETURN STATUS

Error 12796 occurred at disk power-on lifetime: 53 hours
When the command that caused the error occurred, the device was
active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 8f ba 1d e0 Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Timestamp Command/Feature_Name
-- -- -- -- -- -- -- -- --------- --------------------
ef 85 00 8f ba 1d e0 00 19088.625 SET FEATURES [Disable APM]
b0 d5 01 01 4f c2 e0 00 19085.250 SMART READ LOG
b0 d5 01 06 4f c2 e0 00 19085.125 SMART READ LOG
b0 d0 01 00 4f c2 e0 00 19085.000 SMART READ DATA
b0 da 00 00 4f c2 00 00 19084.313 SMART RETURN STATUS

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining
LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 57
-
# 2 Short offline Completed without error 00% 54
-
# 3 Short offline Completed without error 00% 37
-
# 4 Short offline Completed without error 00% 28
-
# 5 Extended offline Completed without error 00% 16
-
# 6 Short offline Completed without error 00% 13
-
 

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